The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 1984
Filed:
Jul. 22, 1980
Robert S Wilks, Plum Borough, PA (US);
Eliezer Sternheim, Pittsburgh, PA (US);
Gerald A Breakey, Penn Township, Allegheny County, PA (US);
Robert H Sturges, Jr, Plum Borough, PA (US);
Alexander Taleff, Churchill Borough, PA (US);
Raymond P Castner, Monroeville, PA (US);
Abstract
Control for the operation of a mechanical handling and gauging system for nuclear fuel pellets. The pellets are inspected for diameters, lengths, surface flaws and weights in successive stations. The control includes, a computer for commanding the operation of the system and its electronics and for storing and processing the complex data derived at the required high rate. In measuring the diameter, the computer enables the measurement of a calibration pellet, stores that calibration data and computes and stores diameter-correction factors and their addresses along a pellet. To each diameter measurement a correction factor is applied at the appropriate address. The computer commands verification that all critical parts of the system and control are set for inspection and that each pellet is positioned for inspection. During each cycle of inspection, the measurement operation proceeds normally irrespective of whether or not a pellet is present in each station. If a pellet is not positioned in a station, a measurement is recorded, but the recorded measurement indicates maloperation. In measuring diameter and length a light pattern including successive shadows of slices transverse for diameter or longitudinal for length are projected on a photodiode array. The light pattern is scanned electronically by a train of pulses. The pulses are counted during the scan of the lighted diodes. For evaluation of diameter the maximum diameter count and the number of slices for which the diameter exceeds a predetermined minimum is determined. For acceptance, the maximum must be less than a maximum level and the minimum must exceed a set number. For evaluation of length, the maximum length is determined. For acceptance, the length must be within maximum and minimum limits.