The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 1984
Filed:
Jan. 29, 1982
Ortwin Muller, Aalen, DE;
Klaus Biber, Aalen, DE;
Heinz Jakubowski, Oberkochen, DE;
Gerhard Hanemann, Oberkochen, DE;
Carl-Zeiss-Stiftung, Heidenheim/Brenz, Oberkochen, DE;
Abstract
The invention contemplates an operation microscope in which three-dimensional viewing adjustment is possible with respect to an object (8) to be observed, all without forcing the surgeon or any co-observing person or instrumentality to move. To this end, the exit pupils and thus all viewing windows are positionally invariant, i.e., they are stationary and therefore can be securely related to a microscope support (5). An objective housing (7) in front of the microscope housing (1) is associated with all viewing systems (2, 3, 4), and this objective housing contains an objective of variable back focus as well as optical components (11, 12) for selective deflection of the observation ray path in each of two polar-coordinate directions. In making any one or all of the three-dimensional viewing adjustments, only elements of relatively low mass within the objective housing (7) need be moved.