The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 1984
Filed:
Jun. 07, 1982
Teruo Watanabe, Kawasaki, JP;
Masaaki Ishikawa, Kawasaki, JP;
Mitutoyo Mfg. Co., Ltd., Tokyo, JP;
Abstract
An instrument is disclosed for measuring internal dimensions by effecting an absolute measurement of an internal dimension of a workpiece using two measuring elements. This instrument for measuring internal dimensions has probes of the measuring elements disposed at two points on a plane incorporating the center axis of a positioning member, the forward end portion of which has a tapered surface, and the probes are adapted to abut against the inner wall surface of the workpiece which is guided by the tapered surface of the positioning member, whereby a distance between the two probes in the aforesaid abutting state is detected by a displacement detecting device, thereby measuring the internal dimension of the workpiece.