The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 1984

Filed:

Oct. 21, 1981
Applicant:
Inventors:

Gijsbertus Bouwhuis, Eindhoven, NL;

Josephus J Braat, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369109 ; 369101 ; 369124 ;
Abstract

An apparatus is described for point-by-point scanning of an object, which may be a phase object, an amplitude object or a combined amplitude and phase object. The object is scanned with a light, sound, electron or X-ray beam which is converged to a spot on the object. A pair of detectors disposed in the path of the modulated radiation coming from the object convert the variations in the radiation into corresponding electrical signals which are fed to a summing circuit. A variable phase shifter connected between at least one of the detectors and the summing circuit is used to introduce a phase shift in the electrical signal such as to optimize the output signal of the summing circuit for the type of object being scanned.


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Bouwhuis, Gijsbertus. (1984). Apparatus for the point-by-point scanning of an object (U.S. Patent No. 4446548). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4446548

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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