The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 1984
Filed:
Mar. 25, 1982
Applicant:
Inventors:
Akira Koyano, Tokyo, JP;
Seiichiro Mizuno, Tokyo, JP;
Assignee:
Aloka Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128660 ; 73620 ;
Abstract
An ultrasonic diagnostic probe scanner for an ultrasonic diagnostic apparatus. The scanner includes a scanner system having six joints, each of which can be rotated within a predetermined plane. The scanner system is supported on a scanner base at one end and has an ultrasonic probe attached thereto at the other end. Each of the six joints is provided with an angle detector to detect the angle of the joint. As a result, the ultrasonic probe can be arbitrarily positioned with an arbitrary beam direction. The positional information obtained from the angle detectors is used to provide the ultrasonic diagnostic apparatus with additional functions.