The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 1984

Filed:

Dec. 07, 1981
Applicant:
Inventor:

James F Wooten, Houston, TX (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 66 ;
Abstract

An electronic test apparatus is provided for evaluating continuity of connections between the pin connectors of a supporting rack for printed circuit boards or the like. Circuit board racks have been provided to receive a plurality of separate modular circuit boards, each of which has a plurality of conductor fingers which fit pin connections or the like in the card (or board) edge connector at the rear of the circuit board supports. The pin connectors for each board are wired together in a selected sequence according to the circuit being constructed by the modules. The test apparatus consists of an electronic circuit including signal lights (LEDs) associated with each pin on card edge connector for the first board slot in the rack to be tested and separate electronic circuits including signal lights (LEDs) associated with each of the pins in each of the other slots in which board modules are to be inserted. When the master circuit is energized for any selected pin in the first slot, the light for that pin will be turned on and the circuit will be completed to and the lights illuminated for the pins for the other slots to which that pin is connected. The master circuit provides for sequencing the connections to the respective pins, thus illuminating in sequence the lights corresponding to each of the pins in the first slot and the lights corresponding the respective pins to which those pins are connected. A probe is also provided for testing for shorts in the equipment.


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