The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 1984
Filed:
Mar. 19, 1982
InterNorth, Inc., Omaha, NE (US);
Abstract
A pre-stressed impact testing device designed to measure the energy which is absorbed during fracture of metal samples under pre-stressed conditions. The device includes a base portion and a pendulum supporting portion which is positioned thereabove. The base portion includes first and second elongated and horizontally spaced-apart beams having opposite ends with a third beam secured to and extending between the first and second beams at one end thereof. A hydraulic ram is secured to and extends between the other ends of the first and second beams for selectively moving the other ends of the first and second beams away from each other so that the first and second beams will be elastically stressed. Connectors are provided on each of the first and second beams for attachment to the opposite ends of the sample material whereby the sample material will be placed in stress when the first and second beams are elastically stressed. A pendulum is positioned on the pendulum supporting portion for impacting and fracturing the sample material. A recorder is provided for measuring the amount of travel of the pendulum after it fractures the sample material.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile