The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 1984
Filed:
Dec. 03, 1982
William E Simon, Cleveland, OH (US);
Richard D Richards, Bay Village, OH (US);
Victoreen, Inc., Cleveland, OH (US);
Abstract
A radiation analysis instrument is described for measuring the characteristics of radiation emanating from a source (XS). The instrument includes two absorbers (a, b) and corresponding detectors (10, 12) with the detectors being disposed in the path of the radiation and the absorbers being interposed between the corresponding detector and the source. A circuit (16) digitizes the analog signals derived by the two detectors and provides the digital values to a microcomputer (18) which stores these digitals values within a memory (50). A microprocessor (48) processes the digital signals stored within the memory (50) to analyze characteristics of the radiation emitted from and the potential applied across the source (XS). This instrument is particularly useful in measuring the kVp applied to X-ray tubes.