The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 1984
Filed:
May. 05, 1981
Applicant:
Inventors:
Jean P Huignard, Paris, FR;
Marcel Malard, Paris, FR;
Assignee:
Thomson-CSF, Paris, FR;
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358209 ; 350-363 ; 350-364 ; 356347 ; 356349 ; 358 90 ;
Abstract
An optical observation system in accordance with the invention comprises illumination means by scanning the object and means for detecting the radiation diffracted by the object. It also comprises an interaction medium in which the wave emerging from the object interferes with a pumping wave in order to induce in it a system of layers diffracting in real time a replica of the object wave propagating in the direction of said wave and a complex conjugate wave propagating in the opposite direction. These waves, which are isomorphic of the object wave help to improve the detection of the object.