The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 1984

Filed:

Mar. 01, 1982
Applicant:
Inventor:

David B Lederer, Rochester, NY (US);

Assignee:

Detection Systems, Inc., Fairport, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250342 ; 250353 ; 340567 ;
Abstract

Disclosed herein is a multiple field-of-view optical system which is adapted for use in electromagnetic radiation-responsive systems, e.g. in passive infrared intruder detection systems. The optical system features an array of optical wedges which are arranged and constructed to intercept radiation propagating toward an optical axis from a plurality of discrete fields of view and refract such radiation in a direction parallel to such axis. A reflective focusing element, preferably parabolic in shape and positioned on said axis, intercepts the radiation refracted by the wedge array and redirects it toward the reflector's focal point. According to a preferred embodiment, the reflective element and wedge array are mounted for relative movement to alter the direction of the various fields of view.


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