The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 1984
Filed:
Nov. 18, 1980
Hans-Jurg Kreiner, Munich, DE;
Abstract
A method and apparatus for detecting .alpha.-rays present in a specified energy range includes a chamber in which is located a filter, an .alpha.detector and a measuring space which is kept at less than 40% of normal atmospheric pressure. The reduced measuring space pressure in turn reduces energy loss of the .alpha.-particles as they travel from the filter to the detector, thereby permitting a high degree of differentiability of the .alpha.-particles according to their energy levels while at the same time providing a large enough sample of .alpha.-particles for .alpha.-activity measurement. Sufficient collimation of the .alpha.-rays is effectuated by limiting the linear distance across the detector receiving surface as compared with the distance between the detector and filter receiving surfaces. The collimation is further improved by tapering conically the inside surface of the chamber toward the detector, and by disposing the average aperture angle of the surface elements of the filter between 90.degree. and 95.degree. with respect to the receiving surface of the detector.