The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 1984

Filed:

May. 13, 1982
Applicant:
Inventors:

Hiroshi Tomiyasu, Yokohamashi, JP;

Hiroaki Tanaka, Kawasakishi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F / ;
U.S. Cl.
CPC ...
7386173 ;
Abstract

An impact flow meter for measuring a horizontal impact force produced by falling material has a frame and a sensing plate having a front surface and a spaced opposite back surface. A hanging device hangs the plate vertically on the frame thereby preventing material from adhering to the plate. A flow guide is mounted in the frame in front of the front surface of the plate at an inclination with the vertical for directing the falling material to the front surface of the plate whereby the plate is struck by the material. An impact force detector couples the back surface of the plate to the frame for measuring the horizontal impact force of the material.


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