The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 1984

Filed:

Dec. 07, 1981
Applicant:
Inventors:

Hisashi Tamura, Tokyo, JP;

Ichizo Ito, Tokyo, JP;

Masashi Hirayama, Tokyo, JP;

Tetsuo Ando, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F / ;
U.S. Cl.
CPC ...
7386124 ; 73DI / ;
Abstract

A vortex flow metering apparatus comprising a sensor unit having first and second piezoelectric sensors selectively arranged in the concavity or a vortex generator having a measured fluid produce a Karman's vortex according to its velocity, a first conversion amplifier to which a signal from the first piezoelectric sensor is applied, a second conversion amplifier to which a signal from the second piezoelectric sensor is applied, an operator circuit to which outputs from the first and second conversion amplifiers are applied and which through addition or subtraction and other operations, removes noise components due to disturbance vibrations. The first and second piezoelectric sensors are selectively arranged at two points whereat stress distribution of the noise component due to disturbance vibration and stress distribution of a signal component due to vortex dynamic lift are different from each other. The invention thus has an unexpectedly high signal to noise ratio, and extraneous noise due to a variety of disturbance vibrations, is substantially eliminated.


Find Patent Forward Citations

Loading…