The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 1984

Filed:

Feb. 16, 1982
Applicant:
Inventors:

Karl A Stetson, Coventry, CT (US);

Irene R Harrison, Manchester, CT (US);

Assignee:

United Technologies Corporation, Hartford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356 355 ; 356349 ; 356356 ;
Abstract

A noncontact optical strain gauge may be used for high temperature objects and objects having a small radius of curvature in the area of interest. The gauge works by means of interferometry applied to the speckle patterns of radiation reflected from two points on the object surface.


Find Patent Forward Citations

Quick Actions:

Stetson, Karl. (1984). Optical strain gauge (U.S. Patent No. 4436419). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4436419

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…