The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 1984
Filed:
Apr. 14, 1982
Harold M Epstein, Columbus, OH (US);
Robert E Schwerzel, Columbus, OH (US);
Paul G Andrus, Powell, OH (US);
Battelle Development Corporation, Columbus, OH (US);
Abstract
Apparatus (10) for obtaining fluorescence laser EXAFS (Extended X-ray Absorption Fine Structure). A lens (12) directs a pulse of radiant energy (13) onto a metal target (15) to produce X-rays (16). A baffle (17) directs the X-rays (16) onto a spectral-dispersive monochromator (18) which directs the spectrally-resolved X-rays (16R) therefrom onto a sample (11). Fluorescence X-rays (27) from the sample (11) strike a phosphor (26) on a grid (19). Emitted light (21) from the phosphor (26) corresponds spatially to the spectral resolution of the X-rays (16R). Emitted light intensity at a point along the spatial distribution corresponds to the absorption characteristics of the sample (11) at a particular wavelength of the incoming X-rays (16R). An imaging lens (20) directs the emitted light (21) onto photographic film or an array detector (22). A reference spectrum of the spectrally-resolved X-rays (16R) is obtained by placing photographic film or an array detector (29) in the path of the spectrally-resolved X-rays (16R) so that only a portion of the X-rays (16R) throughout the spectrum strikes the film or array detector with the remaining portion throughout the spectrum allowed to pass to the sample (11).