The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 1984
Filed:
May. 28, 1982
Ernest J Torok, Minneapolis, MN (US);
William A Harvey, Minneapolis, MN (US);
Sperry Corporation, New York, NY (US);
Abstract
An apparatus for and a method of correcting chromatic aberration in a multiwavelength input light beam deflection system incorporating a magneto-optic diffraction grating is disclosed. The diffraction grating generates a chromatic aberration induced plurality of first order light beams from the multiwavelength input light beam, each different wavelength light beam being deflected a correspondingly different angle .lambda. by the diffraction grating. Correction plates, designed to provide zero chromatic correction for a wavelength .lambda..sub.o with corresponding positive and negative chromatic correction for wavelengths about the wavelength .lambda..sub.o, and associated lenses, parallelize, focus and coaxialize the first order light beams along an output optical axis whereby the chromatic aberration induced first order light beams are combined at the output of the apparatus along an output optical axis, the deflection angle of which is determined by the diffraction grating induced deflection angle of the light of wavelength .lambda..sub.o.