The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 1984

Filed:

Dec. 22, 1981
Applicant:
Inventors:

Jean Liesch, Esch, LU;

Nico Reiff, Luxembourg, LU;

Vlasta Reimen, Esch, LU;

Romain Schmit, Esch, LU;

Arthur Schummer, Esch, LU;

Jo Simon, Esch, LU;

Paul Tonteling, Esch, LU;

Assignee:

ARBED, S.A., Luxembourg, LU;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C21B / ;
U.S. Cl.
CPC ...
250339 ; 250342 ; 73 23 ; 75 42 ; 266100 ;
Abstract

The reducing power of gases liberated at the top of the charge of an industrial furnace is determined by a method wherein the energy radiated from the charge in the range, for example between 1 and 6 microns, covering the radiant energy emitted by the compounds CO.sub.2, CO, H.sub.2, and CH.sub.4 is continuously measured in a multiplicity of detection points distributed over the entire upper surface of the charge and outputs are formed corresponding to the energy radiated at each of the points. An energy image of the energy radiated at the points in the range is formed from the outputs. This energy image is converted into respective specific images for the compounds by isolating from the energy image for each detection point the radiant energy emitted by the compounds. The concentration of each of the compounds at each of the points is calculated from the intensity of the respective specific image. Finally the reducing power at each of the detection points is derived from the respective concentrations of the compounds thereat.


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