The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 1984

Filed:

Jun. 10, 1981
Applicant:
Inventors:

William L Buirley, Dayton, OH (US);

Donald E Koopman, Miami Township, Montgomery County, OH (US);

David B McQuain, Dayton, OH (US);

William H Reeves, Englewood, OH (US);

Assignee:

Vectra International Corporation, Miamisburg, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D / ; G01K / ;
U.S. Cl.
CPC ...
116207 ; 128736 ; 2522997 ; 252962 ; 350351 ; 374137 ; 374162 ; 428-1 ;
Abstract

A temperature measuring device engageable with a surface of any contour to determine the individual temperature of each of the several portions of the surface by providing a thermal map. The map is observable and may be photographed if a record thereof is desired. The temperature measuring device has a portion engageable with the surface and conformable to the surface. The portion which engages the surface includes a coating of cholesteric material, such as microencapsulated liquid crystal material which is temperature-sensitive and light-reflecting. The device also includes a transparent fill material therewithin to transmit the thermal image or map therethrough. Thus, a thermal map or image of the surface is provided. The thermal map is observable and/or recordable through another portion of the device.


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