The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 1984

Filed:

Jul. 22, 1981
Applicant:
Inventor:

James A Kolibas, Broadview Heights, OH (US);

Assignee:

Nordson Corporation, Amherst, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324452 ; 324133 ; 324149 ;
Abstract

An electrostatic system analyzer for checking the voltage at various test points in a high voltage electrostatic spray coating system. The analyzer is in the form of a gun having a telescoping cylindrical barrel with an exposed electrode at its forward end, and a meter at its rearward end, and having a downwardly extending conductive handle. The forward portion of the analyzer body, which is axially and angularly movable relative to the rearward portion, includes a conductive receptacle electrically connected to the electrode, and the rearward, portion of the analyzer body includes four axial bores equidistant from a central axis and equiangularly arrayed thereabout. Each bore contains a resistor, and the resistors are electrically connected in series, with three of the resistors each having an individual plug extending toward the forward analyzer body portion and being receivable for electrical contact within the receptacle when the two portions are telescoped together. The particular resistor coupled to the electrode through the receptacle and its associated plug is determined so as to introduce sufficient resistance from the series of resistors to compensate for resistance variations at different test points in the electrostatic system.


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