The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 1984

Filed:

Jan. 15, 1981
Applicant:
Inventors:

Kiyoshi Itoh, Kamifukuoka, JP;

Yukiyasu Nishikawa, Kawagoe, JP;

Shuji Hoshika, Fujimi, JP;

Ikuzo Okamoto, Tamagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351211 ;
Abstract

A device for measuring the refractive error of an eye in which refractive powers in a plurality of longitudinal directions are simultaneously measured with a high S-N ratio with a high accuracy. A movable chart is provided in a predetermined direction in a plane perpendicular to an optical axis of an optical system which projects the image of the chart onto the retina of the eye being examined. Measuring means measures the refractive error of the eye in accordance with the state of the optical system at the position thereof at which the image projected onto the retina is in focus. The chart has plural striped patterns which are oriented at different angles from one another.


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