The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1984
Filed:
Apr. 08, 1981
Labsystems Oy, Helsinki, FI;
Abstract
A code system for the identification of a sample group to be measured in a multi-channel photometer or in any other multi-channel analysis equipment, e.g. in a spectrophotometer, fluorometer, luminometer, turbidometer, nefelometer, cell counter, or isotope counter. The samples to be measured have been fitted in the matrix form into cuvette sets, sets of test tubes, or pit plates, and the measurement takes place preferably in the vertical direction. The sample group to be measured is provided with a related code piece, such as a code plate, containing the measurement points to be ready by means of the analysis equipment. According to the invention, the measurement points of the code piece are in the same order and with the same relative distances as compared with the measurement channels of the said multi-channel photometer or any other multi-channel analysis equipment, or with a part of or a multiple of said channels. The code piece is arranged so as to be readable by means of the measurement channels of the multi-channel photometer or any other multi-channel analysis equipment in one or several subsequent steps without using a separate code reader.