The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1984
Filed:
Apr. 29, 1983
Applicant:
Inventors:
David L Fair, Chattanooga, TN (US);
Kenneth E Woodard, Jr, Cleveland, TN (US);
David A Helmstetter, Cleveland, TN (US);
Assignee:
Olin Corporation, New Haven, CT (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C25B / ; C25B / ;
U.S. Cl.
CPC ...
204 98 ; 204128 ; 204257 ; 204258 ; 73 40 ;
Abstract
Disclosed is a method of determining which membrane in a multiple unit filter press membrane electrolytic cell is structurally damaged after cell operating conditions and monitorings indicate the problem exists.
Fair, David. (1984). Location of a structurally damaged membrane (U.S. Patent No. 4431495). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4431495
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile