The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 1984

Filed:

Apr. 12, 1982
Applicant:
Inventor:

John H Kennedy, Frederick, MD (US);

Assignee:

Bechtel Power Corporation, San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ; G03B / ;
U.S. Cl.
CPC ...
354113 ; 354132 ; 354219 ; 354294 ;
Abstract

A short-range hand-held photogrammetry system consists of two cameras placed in rigidly fixed photographic positions at the remote ends of a hollow bar. The hollow bar mounting the cameras encloses a wiring harness between the cameras, has attached conventional solenoid actuated shutter closing devices and mounts two downwardly protruding handles for hand holding of the bar and attached cameras. At least one flash unit is wired in series serially through each shutter mechanism of each camera. Both shutters are normally closed and opened for each exposure. These shutters when opened for exposure each close a normally open flash circuit switch. The series connection of the flash actuator requires that both shutters must be opened at the same time for the flash to fire, thus freezing in the same instant of time the pair of stereo photographs, one photograph by each camera. Under each lens of each camera is placed a beam projector that is activated by a pushbutton switch on the back of the bar. Light beams projected by the beam projector are positioned to locate side terminators of the areas of overlap between the two cameras. Photographer reference to the point of beam impact enables a photogrammetric survey to be rapidly taken.


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