The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 1984

Filed:

Feb. 03, 1982
Applicant:
Inventor:

Haruki Nakagawa, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33 / ; 33121 ;
Abstract

This invention discloses a method and an apparatus in which coordinates of points on a plurality of sections of a three dimensional thing are measured based on a plurality of different coordinate systems and then transformed into those in a single reference coordinate system. The coordinates of the section adjacent to the reference section are transformed into coordinates in the reference coordinate system which is used to measure the coordinates of the points on the reference section through the following processes: measuring the coordinates of at least three reference points on the overlapped portion between the reference section and the adjacent section based on the reference coordinate system and the second coordinate system which is used to measure the coordinates of the points on the adjacent section; determining the positional relation between the two systems above using the measured coordinates of the reference points; and then, transforming the coordinates of the points on the adjacent section defined by the second coordinate system into those in the reference section using the above positional relation. The coordinates of points in the other sections are subjected to similar processes to express them in the reference system.


Find Patent Forward Citations

Nakagawa, Haruki. (1984). Method and apparatus for determining the location of points on a three (U.S. Patent No. 4430796). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4430796

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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