The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 1984
Filed:
May. 26, 1981
Robert D Catiller, Garden Grove, CA (US);
Burroughs Corporation, Detroit, MI (US);
Abstract
Apparatus and a technique is disclosed for testing the access time of electronic storage arrays such as bistable storage cells fabricated in accordance with integrated circuit technology. A test pattern generator generates addresses on an 'increment-complement' system and applies these addresses to a memory such as a PROM being tested. All combinations of the rows and columns of the PROM are exercised. Output data from the PROM is split into two separate buses which constitute a direct output bus and a delayed output bus. A first digital comparator compares the respective data signals for each output line on each of the buses in order to ensure that the 'stabilized' output data corresponds exactly to the direct output data. A second digital comparator can be set to establish a standard for the minimum time period at which the output data from the tested PROM has become acceptably stabilized. Specialized clocking and controlled delay times are provided by a digital access control unit.