The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 1984
Filed:
Dec. 01, 1981
William F Beyer, Kalamazoo, MI (US);
Harry S Dankert, Kalamazoo, MI (US);
James C English, Schoolcraft, MI (US);
The Upjohn Company, Kalamazoo, MI (US);
Abstract
An apparatus for automatically establishing fluid communication between a probe and a plurality of containers presented in the sequence to a sampling position includes a container supported rack movable into and out of the sampling position. A probe holder supports the probe for movement into and out of the sampling position. A drive unit connects to the rack and probe holder for effecting and controlling the movements thereof. The drive unit includes a first pressure fluid operated motor actuable for moving the probe into and out of the sampling position for communication with a container thereat and a second pressure fluid operated motor actuable for causing the rack to move a desired one of the containers into the sampling position, the first and second pressure fluid operated motors being actuable independently of each other from a common source of pressure fluid. The apparatus is connectible to provide sequential samples for an analysis system, such as a high pressure liquid chromatography system. In a preferred embodiment the sampler apparatus includes an onboard microprocessor circuit programmable to control sequencing of the pressure fluid motors and timing of the chromatography system. This is in addition to an external computer for processing information resulting from analysis of the samples provided by the sampler apparatus.