The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 1984
Filed:
Aug. 03, 1981
James R Norris, New Fairfield, CT (US);
Dapco Industries, Inc., Ridgefield, CT (US);
Abstract
An ultrasonic inspection apparatus for inspecting a test piece includes an ultrasonic transducer for transmitting test signals into the test piece, for receiving associated response signals reflected back thereto, and for generating a defect signal when a response signal indicates an abnormal condition in the test piece. A control signal generator generates a control signal at predetermined intervals of distance of movement of the transducer relative to the test piece while the transducer generates test signals at a frequency independent the control signal frequency. A principal counter counts the control signals and generates an alarm signal when its count exceeds a value indicating that sufficient defect signals have been generated during movement of the transducer over a predetermined distance to confirm the presence of an unacceptable abnormal condition. A reset counter is connected to the control signal generator for also counting the control signals, is connected to the transducer for receiving defect signals therefrom, and is connected to the principal counter for generating a reset signal therefor. The reset counter is reset by each of the defect signals and generates one reset signal when its count exceeds a predetermined amount indicative of the maximum distance of movement of the transducer during which a defect signal may not be generated from an unacceptable abnormal condition.