The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 1984
Filed:
Jun. 17, 1981
Sakae Sugiyama, Ibaraki, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A method of inspecting non-destructively a specimen for examining the presence or absence of a defect in the specimen, in which an ultrasonic wave is emitted from a probe and a reflected wave from the specimen is received by the probe whose output signal is processed to determine the presence or absence of the defect. The signal processing includes steps of extracting characteristic parameters from a frequency spectrum of the ultrasonic echo and comparing the extracted parameter with corresponding experimentally or theoretically determined values. The invention makes it possible to automatically determine discriminatively whether the reflector of the ultrasonic echo is a configured portion, a weld boundary or a defect of a specimen to be inspected.