The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 1984

Filed:

Feb. 25, 1982
Applicant:
Inventors:

Shunichi Kato, Yokohama, JP;

Tetsuo Aikawa, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
73 65 ; 73483 ; 7386204 ;
Abstract

A device for measuring the imbalance of a disc-like object has at least three load sensors having cantilevers for supporting the object at their corresponding measuring points selected, with a same angular distance therebetween, on a measuring circle which is concentric with a circular through-hole of the object. Each of the caltilevers is extended tangential to the measuring circle and directed perpendicular to the line of sight in the same sense when viewed from the center of the through-hole. A positioning device positions the center of the through-hole in the object relative to the load sensors, and a calculator device for calculating the imbalance of the object using the data supplied from the plural load sensors.


Find Patent Forward Citations

Kato, Shunichi. (1984). Device for measuring the imbalance of an object (U.S. Patent No. 4428225). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4428225

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…