The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 1984
Filed:
Dec. 24, 1980
Fritz Berthold, Weissenburgstr. 12 a, DE;
Other;
Abstract
A method for determining the quench corrected counting yield of samples which emit ionizing radiation that is subject to quenching in a liquid scintillation counter. The output signal of a photoelectric transducer device is used to measure the counting rates of the sample spectrum in different given pulse height ranges. A value characteristic for the quenching is derived from the measurement to determine a quench corrected counting a yield. The value characteristic for the quenching is derived by assigning a given numerical relationship between the counting rates in the different given pulse height ranges; choosing a shift parameter which when varied causes a relative shift between the given pulse height ranges, on the one hand, and the sample spectrum on the other hand; effecting the relative shift by varying the shift parameter until the counting rates take on the given numerical relationship; and determining the shift parameter value that produces the numerical relationship as the value characteristic for the quenching.