The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 1984

Filed:

Jun. 03, 1981
Applicant:
Inventor:

Erhart E Demand, Boston, MA (US);

Assignee:

Temptronic Corporation, Newton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 3241 / ;
Abstract

An improved system for and method of testing electrical components under temperature controlled conditions includes a chamber, within which the component can be mounted, for maintaining a predetermined environmental temperature for the component. A window forming part of a wall of the chamber includes a plurality of flexible, substantially transparent, spaced-apart sheets of plastic film. Dry gas is forced through the space between adjacent sheets to prevent moisture from forming on the sheets. A probe needle can be inserted through any random point of the window into contact with the component disposed within the chamber.


Find Patent Forward Citations

Demand, Erhart. (1984). Electrical testing system including plastic window test chamber and (U.S. Patent No. 4426619). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4426619

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…