The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1984
Filed:
Jun. 19, 1980
Dan Inbar, Haifa, IL;
Giora Gafni, Haifa, IL;
Ernest Grimberg, Kiryat Bialick, IL;
Jacob Koren, Haifa, IL;
Elscint, Ltd., Haifa, IL;
Abstract
A map of a radiation field produced by a gamma camera is corrected for three types of spatially dependent errors in a manner that corrects for each error independently of the others. The errors corrected for are dislocations which result from the non-linearity of the optics, photomultipliers and electronics of the camera, energy window variations resulting from inhomogeneity of the optical system which includes the crystal, light guide, and photomultipliers, and the non-uniform sensitivity of the head resulting from the non-uniform stopping power of the crystal and collimator of the camera head. The map is corrected by obtaining a set of correction factors associated with each type of error using a calibration technique that insures independence between the various correction factors, and applying the correction factors to the map obtained in a nuclear imaging process in a way that independently corrects the map for each type of error.