The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1984
Filed:
Jun. 12, 1981
Applicant:
Inventors:
Robert J Bieringer, Toledo, OH (US);
Sam Lovalenti, Toledo, OH (US);
Assignee:
Owens-Illinois, Inc., Toledo, OH (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
2502 / ; 356240 ;
Abstract
This invention relates to method and apparatus for inspecting glass containers and other types of containers having transparent or translucent sidewalls for defects, and especially to inspecting the finish portion of glass containers for defects such as horizontal checks. The entire finish portion is illuminated by diffused light and the check-type defects reflect light upwardly into an Erfle eyepiece which is then imaged onto a matrix-type light sensor.