The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 1983
Filed:
Dec. 15, 1981
Applicant:
Inventors:
Lilla S Sun, Seal Beach, CA (US);
John C Anderson, Burbank, CA (US);
Assignee:
Beckman Instruments, Inc., Fullerton, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
436-2 ; 436110 ; 356243 ;
Abstract
A method for checking noise of a spectrometer or spectrophotometer. The method is of the type comprising measuring absorbance (A) or percent transmittance (%T) of a solution over a period of time. The method is characterized in that the solution comprises from about 0.040 to about 0.090 M nitrite, the nitrite being present as a nitrite ionized constituent.
Sun, Lilla. (1983). Noise checking method (U.S. Patent No. 4421857). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4421857
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile