The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 1983

Filed:

Nov. 24, 1981
Applicant:
Inventor:

Rudolf Grosskopf, Konigsbronn, DE;

Assignee:

Carl-Zeiss-Stiftung, Heidenheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358107 ; 377 10 ;
Abstract

For the detection of accumulations of particles, for instance metaphase plates, in an image converted by a raster process into electrical signals, there is first effected an electronic dilation in several directions, the parameters of the dilation being so selected that images of the chromosomes of the metaphase plates agglomerate to form unitary structures. Thereupon, an electronic erosion of images is effected in several directions, the parameters of the erosion being so selected that images of cells and impurities disappear but the agglomerated metaphase-plate images are retained. A circuit is described which consists essentially of length discriminators, decision-logic devices, delay-storage devices with provision for establishing input digital preset values, in which circuit the entire evaluation process takes place with the speed of the scanning process.


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