The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 1983
Filed:
Jul. 08, 1981
Toshihide Fujiwara, Hachiouji, JP;
Shinichi Kamachi, Hino, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A fractionating method in electrophoresis wherein, in order to make it possible to automatically and accurately fractionate a pattern obtained by the electrophoresis of a sample to be measured, respective peak tops or minimum points of the pattern obtained by electrophoresizing the sample to be measured are made to correspond to respective peak tops or minimum points to be obtained by electrophoresizing a normal sample by making the basic positions coincide with each other and the minimum points in the sample to be measured located in the positions nearest to the minimum points on the normal sample are made boundary points or the boundary points are determined on the basis of the ratios of the lengths from the basic position to the respective peak tops or minimum points in the sample to be meaured nearest to the values of the above mentioned ratios in the normal sample.