The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 1983
Filed:
Dec. 08, 1980
Volkmar Goetze, Grafenau, DE;
Dieter Schuett, Munich, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Error detection and correction apparatus for a programmable logic array (PLA) having AND and OR logic combinations merged therein is disclosed. The output lines from the AND and OR logic elements are coupled in such a manner that their functions form complete groups containing, if possible, all minterms. Missing minterms are added, as necessary, by special output lines or logic elements provided for that purpose to complete a group. If a minterm occurs on two or more function lines, the corresponding minterm is entered as a correction term into an error detection logic means, one of which is associated with each group of logic output lines. The error detection logic means are also utilized to test whether one, and only one, of the output lines in a grouping of function lines has a binary 1 value. Error correction signals are generated by mixed group error detection means, the inputs of which are connected to a function line of another function group. If a single error is detected, the error detection logic means for the function line groups indicate which group includes the erroneous function line. The mixed group error detection means similarly indicate, if appropriate, which of function lines of the mixed group is erroneous.