The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 1983

Filed:

Jun. 29, 1981
Applicant:
Inventor:

Donald L Horrocks, Placentia, CA (US);

Assignee:

Beckman Instruments, Inc., Fullerton, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
250366 ; 250328 ;
Abstract

A method and related apparatus for the determination of a random coincidence count attributable to chance coincidences of single-photon events which are each detected in only a single detector of a scintillation counter utilizing two detectors in a coincidence counting technique. Real and apparent coincidences of pulses are accumulated in a first counting device (28), and all pulses from the detectors (12) are accumulated in a second counting device (38), without regard for coincidence in time. The two counting devices are monitored during at least one random coincidence monitoring time occurring simultaneously with part of a sample counting period. The length and frequency of occurrence of the random coincidence monitoring times can be selected for particular counting measurement applications.


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