The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 1983
Filed:
Jun. 29, 1981
Donald L Horrocks, Placentia, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
A method of quench correction in liquid scintillation counting which compensates for the effect of sample quench. A quench corrected pulse height window is established for measuring sample scintillations. A pulse height threshold is established distinguishing regions for which a measure of sample quench, derived conventionally, is either proportional to or not proportional to the actual effect of quench on the sample pulse height spectrum. The quench corrected window is compared with the pulse height threshold, and the relative position of the corrected window is adjusted if the comparison step indicates that the window lies in the region of nonproportionality.