The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 1983
Filed:
Dec. 31, 1980
Applicant:
Inventor:
Ichiro Kano, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350513 ;
Abstract
A device for observing, by use of two microscopes, two adjacent regions on two objects which are superposed with respect to the direction of an optical axis is provided with a magnifying and image projecting lens interposed between the microscopes and the objects. The two microscopes are disposed at a space interval between their optical axes which is greater than the space interval between the two adjacent regions, and the two regions of the magnified object images formed by the image projecting lens is observed through these two microscopes.