The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 1983
Filed:
Jan. 05, 1977
Gunther Groh, Hamburg, DE;
Hermann Weiss, Hamburg, DE;
Wolfgang Wagner, Norderstedt, DE;
Klaus Pasedach, Hamburg, DE;
Gunter Kowalski, Hamburg, DE;
Dietrich Meyer-Ebrecht, Hamburg, DE;
U.S. Philips Corporation, New York, NY (US);
Abstract
In fan beam X-ray scanners operating with a large number of detectors, errors at and near the center of rotation are caused by the fact that the radiation absorption in said area is substantially always measured by the same detectors and that the sensitivity of all detectors is not exactly the same. The invention provides an improvement in that the measurement is carried out with a larger number of detectors than is necessary for the measurement of the scanning field and that the detectors pivot during the measurement. As a result, the absorption in the center of rotation is measured by different detectors so that, for a sufficient number of detectors the different sensitivities, errors are averaged and thus reduced or cancelled.