The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 1983
Filed:
Sep. 18, 1981
Applicant:
Inventors:
Assignee:
Fuji Photo Film Co., Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250563 ; 356237 ; 250572 ;
Abstract
An apparatus for detecting and measuring the area of defects in a sheet or rolled material comprises a defect detection section which rapidly scans the whole area of the material to locate the positions of defects and a defect size measuring section which is moved directly to each of the located positions to measure the area of the defect.