The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 1983

Filed:

Mar. 02, 1981
Applicant:
Inventor:

Robert A Buchanan, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; H04N / ;
U.S. Cl.
CPC ...
378 58 ; 358111 ; 364414 ; 378 99 ; 378-4 ; 378 21 ;
Abstract

In an automated real-time radiographic inspection system for detecting flaws, defects or inhomogeneities in manufactured objects, the objects (10, 11, 12, . . . ) to be tested are moved on a conveyor (20) in succession past an X-ray source (30). Penetrating X-ray radiation is transmitted through the objects (10, 11, 12, . . . ) to cause an image to be formed for each object in succession by an electronic imaging system (40). The imaging system (40) generates digital signals representative of the image for each object, and transmits the digital signals to a data processor/comparator (50). One of the objects (10, 11, 12, . . . ) may be considered as a reference object against which the other objects are compared for structural homogeneity. Thus, the electronic images of the objects (11, 12, . . . ) could be compared with the electronic image of, for example, the object (10). Alternatively, the electronic images of the test objects could be compared with an electronic reference image programmed into the data processor/comparator (50), the programmed reference image. The comparison performed by the data processor/comparator (50) is a subtraction process, which eliminates background features common to test and reference images. Thus, any flaw appearing in a test image, but not present in the reference image, stands out in sharp detail. When a flaw occurs in a test image, the subtractive process results in a non-null signal, which activates a conveyor control mechanism (70) for stopping the conveyor (20) so as to enable rejection of the flawed test object.


Find Patent Forward Citations

Buchanan, Robert. (1983). Automated radiographic inspection system (U.S. Patent No. 4415980). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4415980

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