The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 1983

Filed:

Jun. 26, 1981
Applicant:
Inventors:

Guillermo C Gaunaurd, Rockville, MD (US);

Herbert berall, Washington, DC (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
343 / ; 73602 ;
Abstract

An apparatus for and a method of determining the material properties of a dielectric and/or conducting radar target by deciphering the backscattered signals returned from the target is disclosed. The resonance 'code' of the echo signals from the target is a function of the width and spacing of the resonant spectral lines in the transverse electric (TE) and transverse magnetic (TM) modes of the returned signals. The resonances present in any TE or TM mode become uniformly spaced and of uniform width at high frequencies. The uniform spacing between adjacent resonances is used to uniquely determine the dielectric constant of the material comprising the target, and their uniform width is used to uniquely determine its thickness.


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