The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 1983

Filed:

Dec. 04, 1980
Applicant:
Inventor:

Brian D Sowerby, Kareela, AU;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ; G01N / ;
U.S. Cl.
CPC ...
250255 ; 378 53 ;
Abstract

An apparatus and method for quantitatively measuring the concentration of a first element or group of elements having substantially similar atomic numbers in a matrix comprising other elements having substantially different atomic numbers to that or those of said first element or group of elements is diclosed. The apparatus comprises


Find Patent Forward Citations

Sowerby, Brian. (1983). Annihilation radiation analysis (U.S. Patent No. 4415804). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4415804

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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