The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 1983

Filed:

May. 29, 1981
Applicant:
Inventor:

Stanley R Sternberg, Ann Arbor, MI (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382 49 ; 364725 ; 382 27 ;
Abstract

Image analyzing apparatus and methods are disclosed for analyzing 3-dimensional as well as 2-dimensional images. The pixels of the 3-D images may be represented by multivalued digital data signals which are analyzed in one or more programmable neighborhood transformation stages. In the preferred embodiment, each stage is programmed with selected contribution values associated with each pixel in the neighborhood. The values of the data signals for each pixel are modified by these contribution values and the maximum value thereof is selected as the transformation output of the stage. A series of dilation/erosion transformations may be used to transform the original image matrix in such a manner so as to locate the position and/or identify the shape of particular objects contained in the original image.


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