The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 1983
Filed:
Mar. 05, 1982
David E Abrams, Winchester, MA (US);
Raul Curbelo, Lexington, MA (US);
R Brough Turner, Newton Corner, MA (US);
Bio-Rad Laboratories, Inc., Richmond, CA (US);
Abstract
A scanning interferometer is provided with a substantially monochromatic reference beam having a wavelength outside the spectral region of principal interest. Modulation of the reference beam provides a measure of the scan velocity that is compared with a stablized time reference to provide an error signal used to regulate the scan velocity. Modulation of the reference beam also provides a fringe count. At a predetermined count, the time reference is changed in a pre-arranged manner, providing a pre-established scan acceleration sequence at the end of each scan. The acceleration sequence is selected to insure the direction of the scan is reversed within a quarter wave interval of the fringe count, insuring the fidelity of the fringe-count of the monochromatic reference source.