The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 1983

Filed:

Apr. 01, 1981
Applicant:
Inventors:

Joseph K Adlerstein, Kew Gardens, NY (US);

Heinz F Nitka, Binghamton, NY (US);

Charles S Naiman, Brookline, MA (US);

Aryeh Weiss, Cambridge, MA (US);

Assignee:

Xyram Corporation, Tuckahoe, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04M / ;
U.S. Cl.
CPC ...
358111 ; 358213 ; 357 24 ; 378 99 ;
Abstract

An X-ray imaging apparatus includes a transducer for converting incident X-radiation to a corresponding pattern of electrical charges. The charges generated by the transducer are accelerated onto an array of charge-detecting or charge-storing devices which store the charges in the form of an electrical signal corresponding to the charge pattern. The electrical signal may be transferred out of the array of charge-storing devices to an external signal-processing apparatus, such as one employing digital processing techniques, at which the signal may be stored or displayed as an X-ray image.


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