The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 1983
Filed:
Apr. 24, 1981
Hiroshi Tamaki, Tokyo, JP;
Abstract
An apparatus for measuring the optical characteristics of an optical system includes a light source, a collimator lens, a mask, a detector, and a circuit for measuring information received from the detector. The light source projects a beam of light through the collimator lens and then through the optical system. The beam of light then passes through the mask, which has a pattern of at least two non-parallel, straight lines on it, and is projected onto the detector. With the information provided to the circuit by the detector the optical characteristics of the optical system are determined. The circuit determines the optical characteristics of the optical system by evaluating changes in the length and gradient angles of the lines projected onto the detector from the mask.