The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 1983

Filed:

Feb. 24, 1981
Applicant:
Inventors:

Osamu Shindow, Tokyo, JP;

Ikuzo Okamoto, Tamagawa, JP;

Takeshi Machida, Sakado, JP;

Hiroshi Koyama, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356124 ; 356125 ;
Abstract

A hand-held lens meter including first and second optical systems mounted in a substantially Y-shaped hand-holdable body is disclosed. The first optical system includes a target, a lens rest and an objective lens. The target is slidably mounted in a grip portion of the lens meter body while the two optical systems are mounted in the upper legs thereof. The second optical system includes a relay lens, a focusing screen, an eyepiece lens and first and second reflecting surfaces which may be consituted either by first and second mirrors or a pentagonal prism. A prism is provided preferably as the reflecting surface of the first optical system with the prism having an optical path length longer than the outside diameter of the objective lens. The target is slidably moved along the optical axis in response to rotation of a power-measuring dial which is calibrated in terms of the powers of lenses to be measured.


Find Patent Forward Citations

Loading…